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Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for ex...
Gorde:
| Argitaratua izan da: | Solid State Ion |
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| Egile Nagusiak: | , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Elsevier Science B.V
2011
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4986288/ https://ncbi.nlm.nih.gov/pubmed/27570326 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ssi.2010.08.013 |
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