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Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films

In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for ex...

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Detalhes bibliográficos
Publicado no:Solid State Ion
Main Authors: Gerstl, M., Frömling, T., Schintlmeister, A., Hutter, H., Fleig, J.
Formato: Artigo
Idioma:Inglês
Publicado em: Elsevier Science B.V 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4986288/
https://ncbi.nlm.nih.gov/pubmed/27570326
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ssi.2010.08.013
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