An Accurate Value for the Absorption Coefficient of Silicon at 633 nm

High-accuracy transmission measurements at an optical wavelength of 633 nm and mechanical measurements of the thickness of a 13-µm thick silicon-crystal film have been used to calculate the absorption and extinction coefficients of silicon at 633 nm. The results are 3105±62 cm(−1) and 0.01564±0.0003...

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Bibliographic Details
Published in:J Res Natl Inst Stand Technol
Main Authors: Geist, Jon, Schaefer, A. Russell, Song, Jun-Feng, Wang, Yun Hsia, Zalewski, Edward F.
Format: Artigo
Language:Inglês
Published: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1990
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Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC4930019/
https://ncbi.nlm.nih.gov/pubmed/28179791
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.095.043
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