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An Accurate Value for the Absorption Coefficient of Silicon at 633 nm
High-accuracy transmission measurements at an optical wavelength of 633 nm and mechanical measurements of the thickness of a 13-µm thick silicon-crystal film have been used to calculate the absorption and extinction coefficients of silicon at 633 nm. The results are 3105±62 cm(−1) and 0.01564±0.0003...
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| Udgivet i: | J Res Natl Inst Stand Technol |
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| Main Authors: | , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1990
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4930019/ https://ncbi.nlm.nih.gov/pubmed/28179791 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.095.043 |
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