Temperature and layer thickness dependent in situ investigations on epindolidione organic thin-film transistors

We report on in situ performance evaluations as a function of layer thickness and substrate temperature for bottom-gate, bottom-gold contact epindolidione organic thin-film transistors on various gate dielectrics. Experiments were carried out under ultra-high vacuum conditions, enabling quasi-simult...

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Detaylı Bibliyografya
Yayımlandı:Synth Met
Asıl Yazarlar: Lassnig, R., Striedinger, B., Jones, A.O.F., Scherwitzl, B., Fian, A., Głowacl, E.D., Stadlober, B., Winkler, A.
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: 2016
Konular:
Article
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC4913872/
https://ncbi.nlm.nih.gov/pubmed/27340329
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.synthmet.2016.05.003
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