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Temperature and layer thickness dependent in situ investigations on epindolidione organic thin-film transistors
We report on in situ performance evaluations as a function of layer thickness and substrate temperature for bottom-gate, bottom-gold contact epindolidione organic thin-film transistors on various gate dielectrics. Experiments were carried out under ultra-high vacuum conditions, enabling quasi-simult...
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| Vydáno v: | Synth Met |
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| Hlavní autoři: | , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2016
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4913872/ https://ncbi.nlm.nih.gov/pubmed/27340329 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.synthmet.2016.05.003 |
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