A carregar...
Electrical in-situ characterisation of interface stabilised organic thin-film transistors
We report on the electrical in-situ characterisation of organic thin film transistors under high vacuum conditions. Model devices in a bottom-gate/bottom-contact (coplanar) configuration are electrically characterised in-situ, monolayer by monolayer (ML), while the organic semiconductor (OSC) is eva...
Na minha lista:
| Publicado no: | Phys Status Solidi Rapid Res Lett |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2015
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4599138/ https://ncbi.nlm.nih.gov/pubmed/26457122 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/pssr.201510169 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|