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Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices
Many ac quantized Hall resistance experiments have measured significant values of ac longitudinal resistances under temperature and magnetic field conditions in which the dc longitudinal resistance values were negligible. We investigate the effect of non-vanishing ac longitudinal resistances on meas...
Uloženo v:
| Vydáno v: | J Res Natl Inst Stand Technol |
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| Hlavní autoři: | , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1998
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4890950/ https://ncbi.nlm.nih.gov/pubmed/28009360 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.103.037 |
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