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Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices
Many ac quantized Hall resistance experiments have measured significant values of ac longitudinal resistances under temperature and magnetic field conditions in which the dc longitudinal resistance values were negligible. We investigate the effect of non-vanishing ac longitudinal resistances on meas...
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| Publicado en: | J Res Natl Inst Stand Technol |
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| Autores principales: | , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1998
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4890950/ https://ncbi.nlm.nih.gov/pubmed/28009360 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.103.037 |
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