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Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices
Many ac quantized Hall resistance experiments have measured significant values of ac longitudinal resistances under temperature and magnetic field conditions in which the dc longitudinal resistance values were negligible. We investigate the effect of non-vanishing ac longitudinal resistances on meas...
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| Foilsithe in: | J Res Natl Inst Stand Technol |
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| Main Authors: | , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1998
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| Ábhair: | |
| Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4890950/ https://ncbi.nlm.nih.gov/pubmed/28009360 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.103.037 |
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