Spectroscopic microscopy can quantify the statistics of subdiffractional refractive-index fluctuations in media with random rough surfaces

We previously established that spectroscopic microscopy can quantify subdiffraction-scale refractive index (RI) fluctuations in a label-free dielectric medium with a smooth surface. However, to study more realistic samples, such as biological cells, the effect of rough surface should be considered....

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Veröffentlicht in:Opt Lett
Hauptverfasser: Zhang, Di, Cherkezyan, Lusik, Capoglu, Ilker, Subramanian, Hariharan, Chandler, John, Thompson, Sebastian, Taflove, Allen, Backman, Vadim
Format: Artigo
Sprache:Inglês
Veröffentlicht: 2015
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Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4868404/
https://ncbi.nlm.nih.gov/pubmed/26512486
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