Spectroscopic microscopy can quantify the statistics of subdiffractional refractive-index fluctuations in media with random rough surfaces

We previously established that spectroscopic microscopy can quantify subdiffraction-scale refractive index (RI) fluctuations in a label-free dielectric medium with a smooth surface. However, to study more realistic samples, such as biological cells, the effect of rough surface should be considered....

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Opt Lett
Hlavní autoři: Zhang, Di, Cherkezyan, Lusik, Capoglu, Ilker, Subramanian, Hariharan, Chandler, John, Thompson, Sebastian, Taflove, Allen, Backman, Vadim
Médium: Artigo
Jazyk:Inglês
Vydáno: 2015
Témata:
Article
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4868404/
https://ncbi.nlm.nih.gov/pubmed/26512486
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky