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Zhang, Di, Lusik Cherkezyan, Ilker Capoglu, Hariharan Subramanian, John Chandler, Sebastian Thompson, Allen Taflove, and Vadim Backman. "Spectroscopic Microscopy Can Quantify the Statistics of Subdiffractional Refractive-index Fluctuations in Media With Random Rough Surfaces." Opt Lett 2015.

Zhang, Di, et al. "Spectroscopic Microscopy Can Quantify the Statistics of Subdiffractional Refractive-index Fluctuations in Media With Random Rough Surfaces." Opt Lett 2015.