Scanning force microscope for in situ nanofocused X-ray diffraction studies

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imagin...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:J Synchrotron Radiat
Päätekijät: Ren, Zhe, Mastropietro, Francesca, Davydok, Anton, Langlais, Simon, Richard, Marie-Ingrid, Furter, Jean-Jacques, Thomas, Olivier, Dupraz, Maxime, Verdier, Marc, Beutier, Guillaume, Boesecke, Peter, Cornelius, Thomas W.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: International Union of Crystallography 2014
Aiheet:
Research Papers
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC4862253/
https://ncbi.nlm.nih.gov/pubmed/25178002
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514014532
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