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Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns: a numerical study

Crystal defects induce strong distortions in diffraction patterns. A single defect alone can yield strong and fine features that are observed in high-resolution diffraction experiments such as coherent X-ray diffraction. The case of face-centred cubic nanocrystals is studied numerically and the sign...

詳細記述

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書誌詳細
出版年:J Appl Crystallogr
主要な著者: Dupraz, Maxime, Beutier, Guillaume, Rodney, David, Mordehai, Dan, Verdier, Marc
フォーマット: Artigo
言語:Inglês
出版事項: International Union of Crystallography 2015
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC4453968/
https://ncbi.nlm.nih.gov/pubmed/26089755
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576715005324
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