Ren, Z., Mastropietro, F., Davydok, A., Langlais, S., Richard, M., Furter, J., . . . Cornelius, T. W. (2014). Scanning force microscope for in situ nanofocused X-ray diffraction studies. J Synchrotron Radiat.
Styl ChicagoRen, Zhe, et al. "Scanning Force Microscope for in Situ Nanofocused X-ray Diffraction Studies." J Synchrotron Radiat 2014.
Citace podle MLARen, Zhe, et al. "Scanning Force Microscope for in Situ Nanofocused X-ray Diffraction Studies." J Synchrotron Radiat 2014.
Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..