ロード中...
Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy
X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image light element containing structures at a resolution beyond that of the x-ray lens used. These methods can be u...
保存先:
| 出版年: | Proc SPIE Int Soc Opt Eng |
|---|---|
| 主要な著者: | , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2015
|
| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4816490/ https://ncbi.nlm.nih.gov/pubmed/27041790 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2190749 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|