एपीए उद्धरण

Deng, J., Vine, D. J., Chen, S., Nashed, Y. S. G., Peterka, T., Ross, R., . . . Jacobsen, C. (2015). Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy. Proc SPIE Int Soc Opt Eng.

शिकागो स्टाइल उद्धरण

Deng, Junjing, David J. Vine, Si Chen, Youssef S. G. Nashed, Tom Peterka, Rob Ross, Stefan Vogt, और Chris Jacobsen. "Opportunities and Limitations for Combined Fly-scan Ptychography and Fluorescence Microscopy." Proc SPIE Int Soc Opt Eng 2015.

एमएलए उद्धरण

Deng, Junjing, et al. "Opportunities and Limitations for Combined Fly-scan Ptychography and Fluorescence Microscopy." Proc SPIE Int Soc Opt Eng 2015.