Deng, J., Vine, D. J., Chen, S., Nashed, Y. S. G., Peterka, T., Ross, R., . . . Jacobsen, C. (2015). Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy. Proc SPIE Int Soc Opt Eng.
Chicago Style aipamenaDeng, Junjing, David J. Vine, Si Chen, Youssef S. G. Nashed, Tom Peterka, Rob Ross, Stefan Vogt, and Chris Jacobsen. "Opportunities and Limitations for Combined Fly-scan Ptychography and Fluorescence Microscopy." Proc SPIE Int Soc Opt Eng 2015.
MLA aipamenaDeng, Junjing, et al. "Opportunities and Limitations for Combined Fly-scan Ptychography and Fluorescence Microscopy." Proc SPIE Int Soc Opt Eng 2015.
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