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Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy
X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image light element containing structures at a resolution beyond that of the x-ray lens used. These methods can be u...
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| Publicado no: | Proc SPIE Int Soc Opt Eng |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4816490/ https://ncbi.nlm.nih.gov/pubmed/27041790 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2190749 |
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