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Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array
The needs both for increased experimental throughput and for in operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. A novel measurement scheme that allows multiplexed simultaneous...
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| Publicat a: | J Synchrotron Radiat |
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| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2015
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4786085/ https://ncbi.nlm.nih.gov/pubmed/25931081 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515005378 |
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