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Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array

The needs both for increased experimental throughput and for in operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. A novel measurement scheme that allows multiplexed simultaneous...

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Dades bibliogràfiques
Publicat a:J Synchrotron Radiat
Autors principals: Zhang, Fan, Allen, Andrew J., Levine, Lyle E., Mancini, Derrick C., Ilavsky, Jan
Format: Artigo
Idioma:Inglês
Publicat: International Union of Crystallography 2015
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4786085/
https://ncbi.nlm.nih.gov/pubmed/25931081
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515005378
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