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Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array

The needs both for increased experimental throughput and for in operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. A novel measurement scheme that allows multiplexed simultaneous...

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Detalhes bibliográficos
Publicado no:J Synchrotron Radiat
Main Authors: Zhang, Fan, Allen, Andrew J., Levine, Lyle E., Mancini, Derrick C., Ilavsky, Jan
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4786085/
https://ncbi.nlm.nih.gov/pubmed/25931081
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515005378
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