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In Situ Characterization of the Local Work Function along Individual Free Standing Nanowire by Electrostatic Deflection

In situ characterization of the work function of quasi one dimensional nanomaterials is essential for exploring their applications. Here we proposed to use the electrostatic deflection induced by work function difference between nanoprobe and nanowire for in situ measuring the local work function al...

詳細記述

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書誌詳細
出版年:Sci Rep
主要な著者: Chen, Yicong, Zhao, Chengchun, Huang, Feng, Zhan, Runze, Deng, Shaozhi, Xu, Ningsheng, Chen, Jun
フォーマット: Artigo
言語:Inglês
出版事項: Nature Publishing Group 2016
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC4756696/
https://ncbi.nlm.nih.gov/pubmed/26882827
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep21270
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