In Situ Characterization of the Local Work Function along Individual Free Standing Nanowire by Electrostatic Deflection

In situ characterization of the work function of quasi one dimensional nanomaterials is essential for exploring their applications. Here we proposed to use the electrostatic deflection induced by work function difference between nanoprobe and nanowire for in situ measuring the local work function al...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Sci Rep
Hlavní autoři: Chen, Yicong, Zhao, Chengchun, Huang, Feng, Zhan, Runze, Deng, Shaozhi, Xu, Ningsheng, Chen, Jun
Médium: Artigo
Jazyk:Inglês
Vydáno: Nature Publishing Group 2016
Témata:
Article
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4756696/
https://ncbi.nlm.nih.gov/pubmed/26882827
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep21270
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky