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Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain pro...
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| Publicado en: | Struct Dyn |
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| Autores principales: | , , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
American Crystallographic Association
2014
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4714650/ https://ncbi.nlm.nih.gov/pubmed/26798784 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4901228 |
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