Thin film caracterisation by advanced x-ray diffraction techniques /

Eitemau Tebyg

• X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects
  gan: Olivier Thomas, et al.
  Cyhoeddwyd: (2022-04-01)
• Capability of X-ray diffraction for the study of microstructure of metastable thin films
  gan: Rafaja, David, et al.
  Cyhoeddwyd: (2014)
• Elastic constants of fibre-textured thin films determined by X-ray diffraction
  gan: Martinschitz, K. J., et al.
  Cyhoeddwyd: (2009)
• Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
  gan: Schick, Daniel, et al.
  Cyhoeddwyd: (2014)
• Ultrafast x-ray diffraction study of melt-front dynamics in polycrystalline thin films
  gan: Assefa, Tadesse A., et al.
  Cyhoeddwyd: (2020)