Chargement en cours...
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Layer semiconductors with easily processed two-dimensional (2D) structures exhibit indirect-to-direct bandgap transitions and superior transistor performance, which suggest a new direction for the development of next-generation ultrathin and flexible photonic and electronic devices. Enhanced lumines...
Enregistré dans:
| Publié dans: | J Vis Exp |
|---|---|
| Auteurs principaux: | , , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
MyJove Corporation
2015
|
| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4692779/ https://ncbi.nlm.nih.gov/pubmed/26710105 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3791/53200 |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|