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Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurements

Ohmic contact electrodes for four-wire resistance and Hall measurements were fabricated on an individual single-crystal bismuth nanowire encapsulated in a cylindrical quartz template. Focused ion beam processing was utilized to expose the side surfaces of the bismuth nanowire in the template, and ca...

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Detalhes bibliográficos
Main Authors: Murata, Masayuki, Hasegawa, Yasuhiro
Formato: Artigo
Idioma:Inglês
Publicado em: Springer 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3849392/
https://ncbi.nlm.nih.gov/pubmed/24070421
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-400
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