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Optimizing pentacene thin-film transistor performance: Temperature and surface condition induced layer growth modification
In this work we present in situ electrical and surface analytical, as well as ex situ atomic force microscopy (AFM) studies on temperature and surface condition induced pentacene layer growth modifications, leading to the selection of optimized deposition conditions and entailing performance improve...
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| Vydáno v: | Org Electron |
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| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4630869/ https://ncbi.nlm.nih.gov/pubmed/26543442 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.orgel.2015.08.016 |
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