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Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy
[Image: see text] Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which bo...
में बचाया:
| में प्रकाशित: | J Phys Chem C Nanomater Interfaces |
|---|---|
| मुख्य लेखकों: | , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
American Chemical
Society
2015
|
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4620530/ https://ncbi.nlm.nih.gov/pubmed/26523159 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpcc.5b08083 |
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