Caricamento...
Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy
[Image: see text] Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which bo...
Salvato in:
| Pubblicato in: | J Phys Chem C Nanomater Interfaces |
|---|---|
| Autori principali: | , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
American Chemical
Society
2015
|
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4620530/ https://ncbi.nlm.nih.gov/pubmed/26523159 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpcc.5b08083 |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !
|