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Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy
Thin‐film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X‐ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated as...
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| 出版年: | Chemphyschem |
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| 主要な著者: | , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
John Wiley and Sons Inc.
2020
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7702074/ https://ncbi.nlm.nih.gov/pubmed/32820833 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/cphc.202000568 |
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