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Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy
Thin‐film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X‐ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated as...
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| Publicat a: | Chemphyschem |
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| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
John Wiley and Sons Inc.
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7702074/ https://ncbi.nlm.nih.gov/pubmed/32820833 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/cphc.202000568 |
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