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Ionization-induced annealing of pre-existing defects in silicon carbide

A long-standing objective in materials research is to effectively heal fabrication defects or to remove pre-existing or environmentally induced damage in materials. Silicon carbide (SiC) is a fascinating wide-band gap semiconductor for high-temperature, high-power and high-frequency applications. It...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Nat Commun
Prif Awduron: Zhang, Yanwen, Sachan, Ritesh, Pakarinen, Olli H., Chisholm, Matthew F., Liu, Peng, Xue, Haizhou, Weber, William J.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Nature Pub. Group 2015
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4557342/
https://ncbi.nlm.nih.gov/pubmed/26264864
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms9049
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