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Localized Tail States and Electron Mobility in Amorphous ZnON Thin Film Transistors
The density of localized tail states in amorphous ZnON (a-ZnON) thin film transistors (TFTs) is deduced from the measured current-voltage characteristics. The extracted values of tail state density at the conduction band minima (N(tc)) and its characteristic energy (kT(t)) are about 2 × 10(20) cm(−3...
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| Vydáno v: | Sci Rep |
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| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4548246/ https://ncbi.nlm.nih.gov/pubmed/26304606 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep13467 |
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