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Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered Neutrals
Molecular depth profiles of model organic thin films were performed using a 40 keV C(60)(+) cluster ion source in concert with TOF-SIMS. Strong-field photoionization of intact neutral molecules sputtered by 40 keV C(60)(+) primary ions was used to analyze changes in the chemical environment of the g...
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| Publicado en: | Surf Interface Anal |
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| Autores principales: | , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
2011
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4530543/ https://ncbi.nlm.nih.gov/pubmed/26269660 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.3401 |
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