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Retrospective sputter depth profiling using 3D mass spectral imaging
A molecular multilayer stack composed of alternating Langmuir-Blodgett films was analyzed by ToF-SIMS imaging in combination with intermediate sputter erosion using a focused C(60)(+) cluster ion beam. From the resulting dataset, depth profiles of any desired lateral portion of the analyzed field-of...
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| Main Authors: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
2011
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3863432/ https://ncbi.nlm.nih.gov/pubmed/24347744 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.3509 |
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