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Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging
This paper discusses a two step enhancement technique applicable to noisy Helium Ion Microscope images in which background structures are not easily discernible due to a weak signal. The method is based on a preliminary adaptive histogram equalization, followed by ‘slow motion’ low-exponent Lévy fra...
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| 出版年: | J Res Natl Inst Stand Technol |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2014
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4487283/ https://ncbi.nlm.nih.gov/pubmed/26601050 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.119.030 |
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