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Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–in...
שמור ב:
| הוצא לאור ב: | Sci Rep |
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| Main Authors: | , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Nature Publishing Group
2015
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4434847/ https://ncbi.nlm.nih.gov/pubmed/25982229 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10417 |
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