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Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–in...
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| Udgivet i: | Sci Rep |
|---|---|
| Main Authors: | , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Nature Publishing Group
2015
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4434847/ https://ncbi.nlm.nih.gov/pubmed/25982229 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10417 |
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