Analysis of oxygen vacancy in Co-doped ZnO using the electron density distribution obtained using MEM

Oxygen vacancy (V(O)) strongly affects the properties of oxides. In this study, we used X-ray diffraction (XRD) to study changes in the V(O) concentration as a function of the Co-doping level of ZnO. Rietveld refinement yielded a different result from that determined via X-ray photoelectron spectros...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Nanoscale Res Lett
Egile Nagusiak: Park, Ji Hun, Lee, Yeong Ju, Bae, Jong-Seong, Kim, Bum-Su, Cho, Yong Chan, Moriyoshi, Chikako, Kuroiwa, Yoshihiro, Lee, Seunghun, Jeong, Se-Young
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer US 2015
Gaiak:
Nano Express
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC4414861/
https://ncbi.nlm.nih.gov/pubmed/25977658
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-0887-2
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