Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy

Photolithographic methods allow an easy lateral top-down patterning and tuning of surface properties with photoreactive molecules and polymers. Employing friction force microscopy (FFM), we present here different FFM-based methods that enable the characterization of several photoreactive thin organi...

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Библиографические подробности
Опубликовано в: :Scanning
Главные авторы: Shen, Quan, Edler, Matthias, Griesser, Thomas, Knall, Astrid-Caroline, Trimmel, Gregor, Kern, Wolfgang, Teichert, Christian
Формат: Artigo
Язык:Inglês
Опубликовано: Wiley Periodicals, Inc 2014
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Original Articles
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC4286208/
https://ncbi.nlm.nih.gov/pubmed/25183629
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sca.21159
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