Shen, Q., Edler, M., Griesser, T., Knall, A., Trimmel, G., Kern, W., & Teichert, C. (2014). Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy. Scanning.

Shen, Quan, Matthias Edler, Thomas Griesser, Astrid-Caroline Knall, Gregor Trimmel, Wolfgang Kern, und Christian Teichert. "Ex Situ and in Situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy." Scanning 2014.

Shen, Quan, et al. "Ex Situ and in Situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy." Scanning 2014.