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Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy
Photolithographic methods allow an easy lateral top-down patterning and tuning of surface properties with photoreactive molecules and polymers. Employing friction force microscopy (FFM), we present here different FFM-based methods that enable the characterization of several photoreactive thin organi...
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| Publicado no: | Scanning |
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| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Wiley Periodicals, Inc
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4286208/ https://ncbi.nlm.nih.gov/pubmed/25183629 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sca.21159 |
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