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CMUTs with High-K Atomic Layer Deposition Dielectric Material Insulation Layer

Use of high-κ dielectric, atomic layer deposition (ALD) materials as an insulation layer material for capacitive micromachined ultrasonic transducers (CMUTs) is investigated. The effect of insulation layer material and thickness on CMUT performance is evaluated using a simple parallel plate model. T...

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Dades bibliogràfiques
Publicat a:IEEE Trans Ultrason Ferroelectr Freq Control
Autors principals: Xu, Toby, Tekes, Coskun, Degertekin, F. Levent
Format: Artigo
Idioma:Inglês
Publicat: 2014
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4258900/
https://ncbi.nlm.nih.gov/pubmed/25474786
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TUFFC.2014.006481
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