A study on the consequence of swift heavy ion irradiation of Zn–silica nanocomposite thin films: electronic sputtering

Zn–silica nanocomposite thin films with varying Zn metal content, deposited by atom beam sputtering technique were subjected to 100 MeV Ag ion irradiation. Rutherford backscattering spectrometry reveals the loss of Zn with irradiation, which is observed to be greater from thin films with lower Zn co...

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Bibliografski detalji
Izdano u:Beilstein J Nanotechnol
Glavni autori: Pannu, Compesh, Singh, Udai B, Agarwal, Dinesh C, Khan, Saif A, Ojha, Sunil, Chandra, Ramesh, Amekura, Hiro, Kabiraj, Debdulal, Avasthi, Devesh K
Format: Artigo
Jezik:Inglês
Izdano: Beilstein-Institut 2014
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Full Research Paper
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4222341/
https://ncbi.nlm.nih.gov/pubmed/25383280
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.179
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