A study on the consequence of swift heavy ion irradiation of Zn–silica nanocomposite thin films: electronic sputtering

Zn–silica nanocomposite thin films with varying Zn metal content, deposited by atom beam sputtering technique were subjected to 100 MeV Ag ion irradiation. Rutherford backscattering spectrometry reveals the loss of Zn with irradiation, which is observed to be greater from thin films with lower Zn co...

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Bibliographic Details
Published in:Beilstein J Nanotechnol
Main Authors: Pannu, Compesh, Singh, Udai B, Agarwal, Dinesh C, Khan, Saif A, Ojha, Sunil, Chandra, Ramesh, Amekura, Hiro, Kabiraj, Debdulal, Avasthi, Devesh K
Format: Artigo
Language:Inglês
Published: Beilstein-Institut 2014
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Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC4222341/
https://ncbi.nlm.nih.gov/pubmed/25383280
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.179
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