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The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration-Corrected Environmental Transmission Electron Microscope

This article describes the establishment, over a period of ten years or so, of a multi-user, institution-wide facility for the characterization of materials and devices at the nano-scale. Emphasis is placed on the type of equipment that we have found to be most useful for our users, and the business...

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Bibliografski detalji
Glavni autori: Sinclair, Robert, Kempen, Paul Joseph, Chin, Richard, Koh, Ai Leen
Format: Artigo
Jezik:Inglês
Izdano: 2014
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4215512/
https://ncbi.nlm.nih.gov/pubmed/25364299
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