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Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer
We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by con...
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| Hlavní autoři: | , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Institute of Physics
2014
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4126933/ https://ncbi.nlm.nih.gov/pubmed/25161320 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4892075 |
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