Wang, A., & Butte, M. J. (2014). Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer. American Institute of Physics.
শিকাগো স্টাইলে সাইটেশনWang, Andrew, এবং Manish J. Butte. Customized Atomic Force Microscopy Probe By Focused-ion-beam-assisted Tip Transfer. American Institute of Physics, 2014.
এমএলএ সাইটেশনWang, Andrew, এবং Manish J. Butte. Customized Atomic Force Microscopy Probe By Focused-ion-beam-assisted Tip Transfer. American Institute of Physics, 2014.
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