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Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes
Abstract We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced “tip-on-chip” probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm2 drastically perturb the oscillation of the tuning fork, resulting i...
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| Main Authors: | , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2022-05-01
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| Colecção: | Microsystems & Nanoengineering |
| Acesso em linha: | https://doi.org/10.1038/s41378-022-00379-x |
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