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Nonlinear optical imaging of defects in cubic silicon carbide epilayers

Silicon carbide is one of the most promising materials for power electronic devices capable of operating at extreme conditions. The widespread application of silicon carbide power devices is however limited by the presence of structural defects in silicon carbide epilayers. Our experiment demonstrat...

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Autori principali: Hristu, Radu, Stanciu, Stefan G., Tranca, Denis E., Matei, Alecs, Stanciu, George A.
Natura: Artigo
Lingua:Inglês
Pubblicazione: Nature Publishing Group 2014
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC4052718/
https://ncbi.nlm.nih.gov/pubmed/24918841
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep05258
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