Загрузка...
Deep atomic force microscopy
The Atomic Force Microscope (AFM) possesses several desirable imaging features including the ability to produce height profiles as well as two-dimensional images, in fluid or air, at high resolution. AFM has been used to study a vast selection of samples on the scale of angstroms to micrometers. How...
Сохранить в:
| Главные авторы: | , , , |
|---|---|
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
AIP Publishing LLC
2013
|
| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3869821/ https://ncbi.nlm.nih.gov/pubmed/24387435 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4821145 |
| Метки: |
Добавить метку
Нет меток, Требуется 1-ая метка записи!
|