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Deep atomic force microscopy

The Atomic Force Microscope (AFM) possesses several desirable imaging features including the ability to produce height profiles as well as two-dimensional images, in fluid or air, at high resolution. AFM has been used to study a vast selection of samples on the scale of angstroms to micrometers. How...

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Библиографические подробности
Главные авторы: Barnard, H., Drake, B., Randall, C., Hansma, P. K.
Формат: Artigo
Язык:Inglês
Опубликовано: AIP Publishing LLC 2013
Предметы:
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC3869821/
https://ncbi.nlm.nih.gov/pubmed/24387435
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4821145
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